FEI Quanta 200 SEM
The Quanta 200 SEM is a flexible, simple-to-use instrument. It can be operated regular high-vacuum, low-vacuum and ESEM modes for imaging many varieties of sample. The ease of use allows people to get started collecting data quickly after being introduced to the microscope. It uses a conventional tungsten electron source giving a resolution of 3.5nm. The Quanta is equipped with the standard SE and BSE detectors as well as an EBSD orientation mapping system. This instrument is also used for many classes, both undergraduate and graduate.
The Quanta200 is a flexible, simple-to-use, general purpose tungsten source SEM. It can be operated in regular high-vacuum, low-vacuum and full Environmental ESEM modes for imaging many varieties of samples. The ease of use allows people to get started collecting data quickly after being introduced to the microscope. It is equipped with a range of detectors including Secondary Electron (SE), Back Scattered (BSE), Energy Dispersive X-ray analysis (EDS), an internal TV camera (CCD) and a range of special detectors for using the SEM in LV or ESEM mode. Additionally this machine has a TSL Electron Backscatter Diffraction (EBSD) and phase identification system for determining the orientation of crystalline grains in a sample. The results from automatic stage or beam scanning are stored and may be displayed in a variety of different ways including colored maps and pole figures. Features of the Quanta200 include:
- SE, BSE, GSE, EDS, EBSD, and CCD Detectors
- 3.0 nm resolution at 30 kV
- 10 nm resolution at 3 kV
- Accelerating voltage between 200 V and 30 kV