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Accelerated Maturation of Materials (CAMM)
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Characterization
TEM
FEI Image Corrected Titan3 G2 60-300 S/TEM
FEI Tecnai F20 S/TEM
FIB
FEI Helios 600 Dual-Beam (SEM/FIB)
FEI Nova 600 Dual-Beam (SEM/FIB)
SEM
Apreo LoVac SEMs
Thermo Scientific Quattro
FEI Quanta 200 SEM
XRD
Rigaku SmartLab
Rigaku MiniFfex
Optical
Clemex Leica
3D
Robomet 3D
FIB Slice & View
TEM / STEM Tomography
Facilities
Computational Tools
Bayesian Neural Network
CompuTherm LLC - Pandat
Dictra
ThermoCalc
Metallographic Sample Prep
Allied HighTech Parallel Polisher
Buehler Auto Polisher
Struers LectroPol Electropolisher (Room/Cryo Temp)
Processing
AIP Hot Isostatic Press
Gleeble™
Inovati Kinetic Metallization™
Instron ETMT
Magnetron Sputterer
Optomec LENS™
Vacuum Annealing Furnace
Vacuum Arc Melter
TEM Sample Prep
Fischione 1010
Fischione Nanomill (1040)
Struers Tenupol Electropolisher (Cryo Temp)
Testing
Instron ETMT
Research
Image Processing
DMREF: Accelerated Development of Next Generation of Ti Alloys
Experimental Characterization and Testing
Modeling and Simulation
Microstructure Simulator
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TEM
TEM
FEI Image Corrected Titan3TM G2 60-300 S/TEM
FEI Tecnai F20 S/TEM
