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FEI/Philips CM-200T TEM


The CM-200 is a general purpose 200 kV research TEM and is optimized for diffraction analysis and imaging.  It has a wide gap pole-piece to allow large tilt angles of the specimen.  Although it is not considered a high-resolution microscope, it is capable of 0.27nm resolution.  It is equipped with a light element EDS X-ray detector and can sample areas at the 10-20nm scale.

Features of the CM-200 include:

  • 200 kV accelerating voltage with LaB6 cathode
  • Fine Probe and Convergent Beam Electron Diffraction (CBED)
  • 2.7 Å resolution (twin lens) with ±70˚ sample tilt (±45˚ on second tilt)
  • Light Element EDS X-ray detector with digital beam control
  • Gatan Imaging Filter (GIF) for PEELS spectroscopy and Energy-Filtered Imaging
  • Double-tilt, Heating, and Cryo stages for specialized experiments